SN74HC74-EP

Name: SN74HC74-EP
Brand: TI
SKU: SN74HC74-EP
Price: 0.858 USD

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Enhanced Product Dual D-Type Positive Edge Triggered Flip Flop With Clear And Preset

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Data sheet

document-pdfAcrobat Dual D-Type Positive Edge Triggered Flip-Flop With Clear and Preset datasheet

SN74HC74-EP

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Data sheet

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Product details

Number of channels

2

Technology family

HC

Supply voltage (min) (V)

2

Supply voltage (max) (V)

6

Input type

Standard CMOS

Output type

Push-Pull

Clock frequency (max) (MHz)

29

IOL (max) (mA)

5.2

IOH (max) (mA)

-5.2

Supply current (max) (µA)

40

Features

Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode

Operating temperature range (°C)

-55 to 125

Rating

HiRel Enhanced Product

Number of channels

2

Technology family

HC

Supply voltage (min) (V)

2

Supply voltage (max) (V)

6

Input type

Standard CMOS

Output type

Push-Pull

Clock frequency (max) (MHz)

29

IOL (max) (mA)

5.2

IOH (max) (mA)

-5.2

Supply current (max) (µA)

40

Features

Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode

Operating temperature range (°C)

-55 to 125

Rating

HiRel Enhanced Product

TSSOP (PW)

14

32 mm² 5 x 6.4

Controlled Baseline
- One Assembly Site
- One Test Site
- One Fabrication Site
Extended Temperature Performance of -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree⁽¹⁾
Wide Operating Voltage Range of 2 V to 6 V
Outputs Can Drive Up To 10 LSTTL Loads
Low Power Consumption, 80 µA Max I_CC
Typical t_pd = 15 ns
±4 mA Output Drive at 5 V
Low Input Current of 1 mA Max

⁽¹⁾Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly Site
- One Test Site
- One Fabrication Site
Extended Temperature Performance of -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree⁽¹⁾
Wide Operating Voltage Range of 2 V to 6 V
Outputs Can Drive Up To 10 LSTTL Loads
Low Power Consumption, 80 µA Max I_CC
Typical t_pd = 15 ns
±4 mA Output Drive at 5 V
Low Input Current of 1 mA Max

⁽¹⁾Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74HC74 device contains two independent D-type positive edge triggered flip flops. A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements are transferred to the outputs on the positive going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of CLK. Following the hold time interval, data at the D input can be changed without affecting the levels at the outputs.