SLUAB11 November   2025 AMC23C12-Q1 , TMCS1126-Q1 , UCC21750-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1. 1.1 Difference Between SiC and IGBT
    2. 1.2 System SCP Response Time Requirement
    3. 1.3 Different SCP Locations
  5. 2Short-Circuit Mechanism
  6. 3Short Circuit Detection Methods
    1. 3.1 Shunt-Based Method
    2. 3.2 Desaturation-Based Method
    3. 3.3 Hall-Effect Sensor-Based Method
  7. 4Test Setup
  8. 5Measurement Results
    1. 5.1 Shunt Based Measurements
    2. 5.2 Desaturation-Based Measurements
    3. 5.3 Hall-Effect-Sensor Measurements
    4. 5.4 Performance Comparison
  9. 6Conclusion
  10. 7References
Technical White Paper

A Comprehensive Analysis of Different Short-Circuit Protection Methods for SiC MOSFETs